Advantest Q8341 Optical Spectrum Analyzer

The Optical Spectrum Analyzer Q 8341 (Advantest) uses a Michelson interferometer in a wavelength range of 350 to 1000 nm. The mechanical configuration of the interferometer allows a resolutions of 1 pm or 1 GHz in the frequency mode. This resolution as well as a measurement accuracy of 10 pm for interferometers of this size cannot be attained with monochromators, thus allowing accurate measurement of high-grade optical components. It also enables the world's fastest measurement speed of 0.5 s.
This highest resolution is particularly useful for the analysis of blue and blue-violet laser diodes, making the Q8341 an excellent choice for use in research on next-generation laser diodes and the increasingly smaller optical pick-ups.

The demand for optical desk drives such as DVD players and CD players has recently increased rapidly. Given this rapid growth in demand and the falling prices for optical disk drives, a productivity and cost improvement is required for light laser diodes, which are one of the main components in optical disk drives.
The indicated wavelength is always the value in a vacuum. In addition to the wavelength display mode, frequency display can also be selected, with deviations being read out in GHz. The use of the Fourier spectroscopy enables true measurement of the coherence length with a resolution of up to 1 µm. Q8341 allows a value of up to 40 mm to be analyzed. The evaluation itself is made automatically at a keystroke. In the spectral range a curve fitting function can be used.
The built-in HeNe laser as the wavelength source allows a long-term calibrated wavelength performance. The OSA features a small size and only 15 kg weight.

Features

• Wavelength range 350 to 1000 nm
  
• Max. resolution 0.01 nm
  
• Measurement accuracy 0.01 nm
  
• Fast sweep speed 0.5 s
  
• Coherence measurement to 40 mm with 1 µm resolution

Operation

• Versatile display modes such as
• Overlay display for comparison with memory contents, and List display
  
• Display of two separate diagrams (split screen)
  
• Use of several markers
  
• Normalization and direct readout of transmission loss as well as
  
• Automatic bandwidth analysis (e.g. half-value width measurement to RMS, Peak and envelope method)