White Papers for Agilent 6000 Series Oscilloscopes
A collection of technical papers
with helpful information related to the 6000 Series.
 
Deep Memory Oscilloscopes:The New Tools of Choice
This application note examines how deep memory oscilloscopes enable the user to view longer time spans and maintain the maximum sample rate over a broader range of sweep speeds.
Improve Your Ability to Capture Elusive Events
This application note uses a debugging application - an attempt to capture a random and infrequently occurring metastable
state - to illustrate the importance of waveform update rates.
Debugging Embedded Mixed-Signal Designs Using MSO
Design engineers have traditionally used both oscilloscopes and logic analyzers to test and debug these mixed-signal embedded designs,
but a new class of measurement tools known as mixed signal oscilloscopes or MSOs.
Using an MSO to Debug a PIC18-Based Mixed Signal Design
To illustrate the unique advantages of an MSO, this paper shows a typical turn-on and debugging methodology for a mixed signal embedded
design based on a Microchip PIC18 microcontroller.
6000 and 54600 Series Probes and Accessories Data Sheet
To get the most out of your scope, you need the right probes and accessories for your particular application. That’s why Agilent Technologies
offers a complete family of innovative probes and accessories for the 6000 and 54600 Series scopes.
FPGA Dynamic Probe for Mixed-Signal Oscilloscopes
The FPGA Dynamic Probe for MSOs is an industry first that can save design teams hundreds of hours per design with increased visibility
inside your FPGA that can be correlated to external analog content.