Keithley Series 2400 Digital SourceMeter® Instruments

Keithley's SourceMeter family is designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as measurement capabilities. Each SourceMeter instrument is both a highly stable DC power source and a true instrument-grade 51/2-digit multimeter. The power source characteristics include low noise, precision, and readback. The multimeter capabilities include high repeatability and low noise. The result is a compact, single-channel, DC parametric tester. In operation, these instruments can act as a voltage source, a current source, a voltage meter, a current meter, and an ohmmeter. Manufacturers of components and modules for the communications, semiconductor, computer, automotive, and medical industries will find the SourceMeter instruments invaluable for a wide range of characterization and production test applications.

The Model 2400 SourceMeter solution is a 20W instrument that allows sourcing and measuring voltage from ±5µV (sourcing) and ±1µV (measuring) to ±200V DC and current from ±10pA to ±1A. It's well-suited for testing a wide range of devices, including diodes, resistors, resistor networks, active circuit protection devices, and portable battery-powered devices and components. It's also useful for systems power sourcing and IDDQ testing applications

Key Features and Specifications

• New class of instruments designed for high speed DC testing
• Family of products offers wide dynamic range: 10pA to 10A, 1µV to 1100V, 20W to 1000W
• 4-quadrant operation
• 0.012% basic accuracy with 5 1/2-digit resolution
• 6-wire O measurement with programmable I source and V clamp
• 1700 readings/second at 4 1/2 digits via GPIB
• Built-in comparator for fast pass/fail testing
• Optional contact check function
• Digital I/O for fast binning and connection to component handlers
• GPIB, RS-232, and Trigger Link interfaces
• TestPoint™ and LabVIEW™ drivers
  

Six Source and Measurement Range Choices
The SourceMeter family offers a choice of six sets of source and measurement ranges, so test system developers can select the instrument best suited for the types of components to be tested.

• The Model 2400 SourceMeter solution is a 20W instrument that allows sourcing and measuring voltage from ±1µV to ±200V DC and current from ±10pA to ±1A.

• The Model 2410 High Voltage SourceMeter solution is a 20W instrument that sources and measures voltage from ±1µV to ±1100V and current from ±10pA to ±1A.

• The Model 2420 High Current SourceMeter solution is a 60W instrument designed to source and measure voltage from ±1µV to ±60V and current from ±100pA to ±3A.

• The Model 2425 SourceMeter solution is a 100W instrument designed to source and measure voltage from ±1µV to ±100V and current from ±100pA to ±3A.

• The Model 2430 Pulse Mode SourceMeter solution is a 1000W instrument designed to source and measure voltage from ±1µV to ±100V and current from ±100pA to ±10A in pulse mode.

• The Model 2440 SourceMeter solution is a 50W instrument designed to source and measure voltage from ±1µV to ±40V and current from ±100pA to ±5A.

All six SourceMeter instruments are suitable for making a wide range of DC measurements, including resistance at a specified current or voltage, breakdown voltage, leakage current, insulation resistance, and electrical characterization.

The 2400 line lets you perform high-speed single or multi-point pass/fail testing on a wide range of components.The line's 1000 rdgs/s at 41/2 digits through a GPIB (IEEE-488) connection ensures higher throughput. The buffer memory can store up to 5000 51/2-digit readings. An on-board comparator simplifies high-speed pass/fail tests without the delay of computer/IEEE-488 interaction.

A digital I/O interface lets you link the 2400 family to many popular component handlers. A Source Memory List allows up to 100 instrument configurations to be stored in memory, each containing source settings, sense (measurement) settings, and pass/fail criteria.

Devices:

• Discrete semiconductor devices
• Passive devices
• Transient suppression devices
• ICs, RFICs, MMICs
• Laser diodes, laser diode modules, LEDs, photodetectors
• Circuit protection devices: TVS, MOV, Fuses, etc.
• Airbags
• Connectors, switches, relays
  

Tests:

• Leakage
• Low voltage/resistances
• LIV
• IDDQ
• I-V characterization
• Isolation and trace resistance
• Temperature coefficient
• Forward voltage, reverse breakdown, leakage current
• DC parametric test
• DC power source
• HIPOT
• Dielectric withstanding
  

White Paper

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