Keithley Integra Series 2750

DMM, Data Acquisition, Switching, Datalogging System w/ 5 Slots

Key Features and Specifications

• Up to 200 differential input channels (with 300V isolation) for measurement and control
• Combines functions of DMM, switch system, and datalogger
• True 6 1/2-digit (22-bit) resolution
• 1O range with 1µO resolution
• 20mV clamp for dry circuit testing
• Choice of 12 switch/control plug-in modules
• TestPoint™ start-up software
• LabVIEW™, LabWindows/CVI, Visual Basic, C/C++, and TestPoint drivers
• Optional ExceLINX™-1A datalogging software
  

Integra Series systems (2700, 2701, 2750) combine precision measurement, switching, and control in a single, tightly integrated enclosure for either rack-mounted or benchtop applications. These cost-effective, high performance test platforms offer affordable alternatives to separate DMMs and switch systems, dataloggers/recorders, plug-in card data acquisition equipment, and VXI/PXI systems. The Integra Series plug-in switching and control modules offer unmatched flexibility and testing efficiency for a wide range of industries and applications. System builders can create test solutions with a combination of channel count, cost per channel, and system performance unmatched by any other single-box measurement system. The input modules provide the flexibility to vary the channel count from 20 to 200 (2-pole), apply a stimulus to the device under test, route signals, control system components, and make precision measurements with up to 14 functions. Robust digital I/O capabilities can be used for triggering, handshaking with other automation equipment, and alarm limit outputs. Scan rates of up to 500 channels/second (up to 3500 readings/second on a single channel) will increase test productivity.

Related Applications

• Production test of electronic products and devices
• Accelerated stress testing (AST)
• Process monitor and control
• Device characterization/R&D
• Low ohms, multichannel measurements

White Paper

• Fundamentals of HALT/HASS Testing
• New Test Realities for Evolving FPD Technologies