TEK PP6561A Small Geometry Probe
Features
The P6561A, P6562A, and P6563A are scaled for surface mounted IC packages.
Their low-mass probe body is only 1.5 inches long and 100 mils wide.
Designed to match the oscilloscope's performance, these probes provide
solutions for the most popular EIAJ and JEDEC surface mount packages.
Surface Mount Device Probing
While instrumentation improvements have provided a steady stream of digital
troubleshooting tools, the physical challenges associated with probing
small geometry ICs have gone unaddressed until now. SMD probes from Tektronix
provide circuit designers the first complete, off-the-shelf solution for
probing small geometry IC packages.
Unique Utility
The basic contact of the SMD probe family is a 25 mil socket that accepts
square or round pins. A variety of tip adapters permits convenient, non-destructive,
temporary connection to the most popular EIAJ and JEDEC surface mount
packages.
Each SMD probe is designed to minimize capacitive loading on TTL, ECL,
CMOS, FastCMOS and BiCMOS circuits. The probe and oscilloscope form a
measurement system optimized for circuit designers by providing fast transient
response, high system bandwidth and low capacitive circuit loading.
Figure 1 presents a sample conversion of the SMD probe family's capacitive
circuit loading to an equivalent number of typical CMOS gates. Being aware
of the potential effects of probe loading on the circuit under test can
eliminate chasing false indicators, reduce test times and lead to more
accurate and repeatable measurements.
Probing Tip
For improved signal fidelity and probing convenience, a short ground
blade is included. To use it, form a ground plane of copper clad on top
of the IC to be probed. Attach short jumper wires from the device ground
to the copper clad. Then, with the SureFootTM probe tip installed,
probe the device and display a cleaner signal on the scope.
SMD Package Support
- 50 mil SO/SOIC
- 50 mil QUAD
- 25 mil JEDEC
- 0.5 mm EIAJ
- 0.65 mm EIAJ
Circuit Compatibility
- CMOS
- BiCMOS
- FastCMOS
- TTL
- ECL
Scope Compatibility
- TDS Series
- TAS Series
- 2400 Series
- 11000 Series
Applications
- Easy Access
- General Purpose Relative Measurements
- Digital Design
- Device Characterization
Specifications
| Probe
Set |
P6561A |
P6562A |
P6563A |
| Digitizing Oscilloscopes |
TDS 300 |
TDS 400, 2400, 11000 |
TDS 500/600/700 Series |
| Analog Oscilloscopes |
TAS
400 |
2400 |
|
| Scope Plug-ins |
|
11A32, 11A34/V |
|
| Bandwidth
(-3 dB) |
200 MHz |
350 MHz |
500 MHz |
| Rise Time (typical) |
<1.85 ns |
<1.1 ns |
<800 ps |
| Uniform
Signal Delay |
±150 ps |
±125 ps |
±100 ps |
| Attenuation |
10X |
10X |
20X |
| Device Loading
Capacitance (typical) |
<11
pF |
<11
pF |
<5
pF |
| Device Loading Resistance |
10 megaohm |
10 megaohm |
9.5 megaohm |
| Maximum
Non-destructive Input Voltage |
42 V
(DC + peak AC) |
42 V
(DC + peak AC) |
42 V
(DC + peak AC) |
| Compensation Range |
15 pF - 35 pF |
12 pF - 35 pF |
7 pF - 30 pF |
| Length |
1.3
m |
1.3 m |
1.3 m |
|
MetricTest
Solutions
